File:Probes on bevel.jpg

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current20:10, 12 December 2008Thumbnail for version as of 20:10, 12 December 20083,794 × 2,873 (454 KB)commons>Rogerprocessengineer{{Information |Description=Illustration of the probing of a beveled piece of silicon. (Typically, 60 to 100 or more measurements are made.) |Source=self-made |Date= |Author= Rogerprocessengineer |Permission= |other_versions=

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