File:Illustration of C-V measurement.gif

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Illustration_of_C-V_measurement.gif ‎(322 × 308 pixels, file size: 93 KB, MIME type: image/gif, looped, 18 frames, 5.4 s)

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current19:26, 17 May 2010Thumbnail for version as of 19:26, 17 May 2010322 × 308 (93 KB)commons>Beatnik8983{{Information |Description={{en|1=C-V measurements can reveal oxide thickness, oxide charges, contamination from mobile ions, and interface trap density in wafer processes. In this image the C-V profile for a bulk p-type substrate MOSCAP with different ox

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